Localized conductivity measurement in nanoscale generates great interest due to its many applications ranging from nanomaterials, energy conversion materials and devices, to semiconductor devices. The development of Atomic Force Microscopy (AFM) enables localized conductivity measurement by using conductive probes and high sensitive amplifiers. However, it is technically challenging to get quantitative electric properties with desirable repeatability. This is because the local contact between probe and sample is not well controlled. In addition, the normal force and shear force during scanning will often affect either the probe or samples or both. Delicate soft samples make these challenges more pronounced. Better force control and minimizing tip wearing & sample damage are always desirable.
In this webinar, we will discuss the optimization in operating AFM based conductivity, including probe selection, sample preparation, normal force setting, scan rate, choosing different imaging modes. We will also report the recent developments in conductivity measurements, which is based on newly developed peak force tapping technology. Some application examples will also be discussed in this webinar.
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