Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal publishes research papers on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on light optical, electron-beam, X-ray microtomography, ion microscopy and scanning-probe imaging.
It also carries review papers, short communications, thematic issues on contemporary developments in microscopy & microanalysis, as well as tutorial papers describing microscopy techniques for current practitioners or newcomers in the field. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
Authors are encouraged to contact one of the Editors directly to discuss Review or Tutorial proposals: https://www.journals.elsevier.com/micron/editorial-board
Benefits to authors
We provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.
Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our Support Center.
Micron enables researchers to rapidly share their most exciting work with their colleagues. The expected time from submission to final decision is approximately 5 weeks.
The journal does not have page limits, so supplementary text is unnecessary and should be avoided.
Authors are encouraged to deposit supplementary materials during submission, e.g. videos and research data, in a relevant data repository such as Mendeley Data and cite and link to this dataset in their article. There are several ways you can share your data, which helps you get credit for your work and make your data accessible and discoverable for your peers. To deposit your data please follow the Research Data Guidelines.
Note to the authors
No changes in the list authors will be accepted during the review process or after acceptance unless such a claim is duly justified by the authors.