Watch this on-demand free webinar by Logging In or Signing Up below.
DualBeam FIB/SEMs, integrated Focused Ion Beams with Scanning Electron Microscopes are routinely used to characterize structural information at the micro- and nanoscale. Xe Plasma FIB/SEMs have enabled researchers to access larger volumes of materials and metals with large grain structure to improve statistical accuracy for 2D and 3D analysis because of their large throughput capabilities. Xe Plasma FIB/SEM technology enables dramatically improved material removal rates compared to traditional methods - while maintaining exceptional surface quality and high-contrast, ultra high resolution imaging performance.
Novel strategies are being developed to produce samples for site specific 3D-EBSD analysis, fabrication of samples for dynamic mechanical testing and Gallium free thin sections for S/TEM analysis, using in-situ manipulators in combination with the large throughput capability of the Plasma FIB. We will discuss how Xe Plasma FIB technology opens the doors to new research applications such as the visualization and analysis polycrystalline metal samples after mechanical stress.
In addition to the ultra high-resolution capabilities, the webinar will examine the wider potential of Xe Plasma FIB technology for a variety of characterization techniques such as preparing samples for mechanical tests, TEM analysis and site specific 3D-EBSD & 3D-EDS.
- Hear from expert speakers how large volume serial sectioning can help bridge the current gap in multiscale materials characterization.
- Discover solutions for rapidly creating large volume 3D material reconstructions.
- Learn more about new research applications for Materials Science using Xe Plasma FIB ?technology.
- Discuss your large volume materials characterization applications with experts.
Tom Nuhfer, Director of Electron Microscopy and Materials Characterization, Department of Materials Science and Engineering, Carnegie Mellon University.
Brandon Van Leer, Business Development and Product Marketing Engineer, FEI.
Joe d'Angelo, (Moderator), Materials Science Publisher, Elsevier.