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Atomic force microscopy (AFM) and infra-red (IR) spectroscopy are complementary techniques in the structural and compositional investigation of a wide range of soft and hard materials. AFM is known to provide high-resolution characterization of local topographic, mechanical, and thermal properties. IR spectroscopy provides robust techniques for performing chemical analysis by analyzing the spectrum of IR light absorbed by the sample due to excitation of chemical bonds.
By combining the strength of AFM and IR spectroscopy, a new probe-based measurement technique called AFM-IR enables characterization and chemical composition mapping with resolutions well beyond the optical diffraction limit, reaching down below 50nm. AFM-IR allows for detailed studies of structure-property correlations on a uniquely broad range of application spanning physical and life sciences.
In this webinar, we will review the fundamental aspects of AFM-IR and draw examples from application in:
• polymers, polymer blends/composites/laminates;
• materials for energy, i.e. organic photovoltaics, biofuels, fuel cells;
• self-assembled monolayers and other thin films;
• materials physics, i.e. semiconductors (joint work with Intel), plasmonics;
• biomaterials, i.e. amyloids, cells, bacteria, viruses, bone and tissue
Why should I attend the webinar?
• Learn about the breakthrough AFM-IR technique explaining its rapid growth and adoption as method of choice for chemical identification and composition mapping at the nanoscale.
• Providing sub-50nm spatial resolution, AFM-IR provides an entirely new way to explore materials across a diverse range of applications spanning physical and life sciences
• Our panel of experts will review the latest AFM-IR research results on an array of new applications such as biofuels, organic monolayers; polymeric blends, multilayer films, semiconductors, organic electronics, plasmonics and life sciences samples such as amyloid fibrils, lysozymes, cells and sub-cellular components, bacteria, and viruses.
Curt Marcott, Senior Partner, Light Light Solutions
Craig Prater, CTO, Anasys Instruments
Kevin Kjoller, Co-founder / VP, Anasys Instruments
Baptiste Gault (Moderator), Materials Science Publisher