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Materials science and X-ray techniques

27 November 2008
J.D. Brock and Mark Sutton

Many novel synchrotron-based X-ray techniques directly address the core questions of modern materials science but are not yet at the stage of being easy to use because of the lack of dedicated beamlines optimized for specific measurements.

For over 100 years, our fundamental understanding of the structure of materials on atomic length scales has been advanced by direct structural measurements using X-rays. However, the flux available from sealed-tube and rotating-anode laboratory X-ray sources limits the materials whose atomic-scale structure can be solved to those that can be crystallized.

This article is featured in:
Characterization • Energy

Feature

Materials science and X-ray techniques

Many novel synchrotron-based X-ray techniques directly address the core questions of modern materials science but are not yet at the stage of being easy to use because of the lack of dedicated beamlines optimized for specific measurements.

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Feature

Materials science and X-ray techniques

Many novel synchrotron-based X-ray techniques directly address the core questions of modern materials science but are not yet at the stage of being easy to use because of the lack of dedicated beamlines optimized for specific measurements.

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