The scanning probe instrument family includes various surface characterization tools that measure surface force interactions; these ‘force microscopy’ tools include AFMs2 G. Binnig et al., Phys. Rev. Lett. 56 (1986), p. 930. Full Text via CrossRef, magnetic force microscopes, electrostatic force microscopes, lateral force microscopy, and so on. The AFM has been used to characterize surfaces of inorganic materials, organic materials, and biological entities.

Scanning probes can also be used to produce high-resolution spatial mapping of topography, hardness, temperature, emitted or reflected light, charge distribution, and vibration magnitude. SPM probes have also been widely used in surface modification, in either additive mode, subtractive mode, electrochemical reaction mode, or thermal phase change mode. Since scanning probes are essentially nanoeffectors connected to high-precision mechanical movement controllers, they have been used as manipulators.