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X-Max Large Area Analytical EDS SDD

12 June 2009

The new X-Max Silicon Drift Detector (SDD) offers users over TEN times the solid angle of conventional EDS detectors... without compromising on performance. Now you can have count rate, imaging, and analytical performance all at the same time.

The new X-Max Silicon Drift Detector (SDD) offers users over TEN times the solid angle of conventional EDS detectors... without compromising on performance.   Now you can have count rate, imaging, and analytical performance all at the same time. 

 
X-Max comes in 3 different active area sizes:  20mm², 50mm², and a staggering 80mm².  All have identical world-beating analytical performance.

 

  • Unique single sensor large area SDD sensors
  • Up to 80mm² active area
  • Count rates > 500,000 cps
  • Throughput > 200,000 cps
  • MnKα typically 125eV
  • Optimised electron trap
  • Vacuum enclosed sensor to reduce oxygen absorption
  • Only one pulse processing channel required
  • Standard tube diameter (no larger than that of a 10mm2 SDD detector)
  • Motorised slide as standard
  • Pile up correction software for accurate analysis at high count rates

Contact: http://www.oxford-instruments.com/Pages/home.aspx

 

 

This article is featured in:
Characterization  •  Nanotechnology