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‘Watching’ processes in soft matter with SPM

24 August 2009
Jamie K. Hobbs et al.

Scanning probe microscopy (SPM) techniques can obtain nanoscale images of soft materials in almost any environment and over a wide range of temperatures. Being non-destructive, processes such as crystallization can be followed in-situ, and the effect of changes in temperature on structures can be monitored at the nanometre scale. The application of these techniques over recent years has lead to a real change in our understanding of many fundamental processes.

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This article is featured in:
Characterization  •  Polymers and soft materials