Today, extensive imaging modalities have been implemented on the atomic force microscope (AFM) under the classification of scanning probe microscopy (SPM) techniques. In addition to topographical imaging, SPM has been used to measure magnetic fields, friction gradients, potentials, capacitance, current flow, piezo response, and temperature (to name a few) across a diverse array of samples. Wider commercial availability of user-friendly instrumentation has put the AFM into the hands of more researchers, not only pushing the boundaries of its application in particular fields, but also bringing together scientists at the interfaces between disciplines.
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