At Materials Today our objective is to progress the understanding of advanced technologies and processes relevant to the materials research community. Working with leading experts from academia and industry, we use the webinar format to generate and promote educational forums to help you in your research needs.
Forthcoming Webinars
Date: 29 September 2010,
Duration: 1 hours
CSM Instruments is pleased to announce our webinar entitled "Nanomechanical characterization of the most challenging soft materials". This is presented in partnership with Materials Today (Elsevier) and is scheduled on September 29th.
Characterization of soft materials such as polymers, elastomers gel or cell by indentation has always been a challenging task because these materials show almost always time dependent mechanical properties. Their visco-elastic properties are characterized by storage and loss moduli whereas response of the material to constant load is described by its creep properties. Since these properties are time dependent, the use of experimental techniques with perfect thermal stability is required so that the results are not discredited by the inherent error of the measurement technique. The most important source of errors in indentation is phenomenon called thermal drift, i.e. change in displacement signal while constant load is applied on a thermally stable material such as fused silica.
Archive
Date: 15 July 2010, 11am EDT, 4pm BST
Duration: 1 hours
In the next part of the Hysitron Webinar Series, we continue to examine a more focused group of applications relating to the study of biomaterials.
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Date: 17 June 2010, 11am EDT, 4pm BST
Duration: 1 hours
In part 3 of the Hysitron Webinar Series, we examine a more focused group of applications relating to the study of biomaterials.
Date: 2 June 2010, 16.00 BST, 17.00 CEST, 11.00 EDT
Duration: 1 hours
This webinar will deal with some of the basic and advanced developments in EDS analysis and address some of the peculiarities of the technique.
Date: 16 March 2010, 1600 GMT, 12 EST
Duration: 1 hours
We invite you to join a web based discussion on new methods for patterning biological systems onto a variety of surfaces at nano- and micro-scale resolution.
Date: 9 March 2010, 16.00 GMT
Duration: 1 hours
Raman spectroscopy is a laser light scattering technique, if you like a form of vibrational spectroscopy that records vibrations of covalent bonds and provides detailed molecular information, ideal in the elucidation of carbon nanomaterials.
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Date: 15 December 2009, 11:00 EST, 16:00 GMT
Duration: 1 hours
The combination of traditional nanomechanical test instruments with complementary techniques has generated innovative ways to characterize nanoscale materials.
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Date: 18 November 2009, 11:00 EST, 16:00 GMT
Duration: 1 hours
Next generation materials research is highly dependent on the development and application of innovative nanomechanical testing techniques.
Date: 17 November 2009, 9am (PDT), 12pm (EDT), 5pm (GMT)
Duration: 1 hours
Self-assembly has been likened to taking a jigsaw puzzle box, shaking it and when you open the box you find the jigsaw puzzle correctly made! As research in this field develops, we are continually finding more and more naturally occurring self-assembly systems in the complex world around us.
Date: 16 September 2009, 4pm UK 11am EST
Duration: 1 hours
Over the past 20 years the SEM (scanning electron microscope) based EBSD (electron back-scattered diffraction) technique has developed into an essential materials characterisation tool for both R&D and industry.
Date: 14 May 2009, 4pm UK
Duration: 1 hours and 10 minutes
This educational webinar headed by Dr Andrew Dixon, one of the pioneers of the confocal microscope will introduce you to the principle and history of the technique, giving examples and typical applications in materials science. You will learn about the advantages this powerful tool has to offer, as well as the unique opportunity of asking our expert panel questions relevant to your current research needs.
Date: 12 December 2008, 4pm UK
Duration: 50
Energy Dispersive Spectrometry (EDS) has long been admired for its ability to quickly and accurately characterise a large and diverse range of materials. The recent introduction of silicon drift detectors (SDDs) has revolutionised EDS analysis on scanning electron microscopes (SEMs). Collection times have been reduced and spectrum imaging is much more practical, but productivity is often limited by small sensor sizes (<30mm²).