Description: Energy Dispersive Spectrometry (EDS) has long been admired for its ability to quickly and accurately characterise a large and diverse range of materials. The recent introduction of silicon drift detectors (SDDs) has revolutionised EDS analysis on scanning electron microscopes (SEMs). Collection times have been reduced and spectrum imaging is much more practical, but productivity is often limited by small sensor sizes (<30mm²). Recent technological innovations in SDD manufacturing have resulted in new large area SDD detectors with active areas up to 80mm² being available. These have all the benefi ts of a traditional SDD (including LN2-free cooling, fast count rates and excellent resolution) and now can be exploited at low beam currents and low voltages. This landmark webinar is headed up by Dr Peter Statham, Director of Research at Oxford Instruments Analytical, and Professor Phillip Russell, Distinguished Professor of Physics and Science Education at Appalachian State University. It will begin by discussing how EDS analysis has progressed in recent years with the introduction of silicon drift detectors. The latest innovations in SDD detectors will be introduced followed by a discussion of the advantages large area SDD detectors can offer and examples of how you can achieve huge improvements in productivity, particularly for nano-scale analysis, while reducing sample damage and contamination. “I would not normally have tried to do these types of experiments on an SEM, but the improved
sensitivity and increased count rates allows me to investigate nanostructured materials and devices in
incredible detail. Without changing anything but my detector I have opened up a new world
of analysis”.
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