The Clemson University electron Microscopy Workshop Topics: • Variable Pressure Scanning electron Microscopy (VPSEM) Instructor: Dr. David Joy • Focused Ion Beam (FIB) Instructor: Dr. Phil Russell, Laboratory Dr. JoAn Hudson • Electron Backscatter Diffraction (EBSD): Instructor, Dr. Joe Michael Continuing Education Credits will be offered. Contact: Dayton Cash, AMRL 91 Technology Drive, Anderson, SC 29625 Telephone: 864-656-2465 Fax: 864-656-2466

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