The annual Microscopy & Microanalysis Meeting is the premier meeting for materials scientists, biological scientists, and nanotechnologists who use microscopy or microanalysis in their professional activities. Microscopy & Microanalysis 2010 will be no exception! In recent years there has been a special emphasis placed on fostering greater inclusiveness in the Microscopy & Microanalysis meetings. We welcome researchers and technologists who may not routinely attend this meeting. To this end, there are several areas of specific focus for M&M 2010, including an exciting plenary, opening symposium. The keynote speaker of this plenary session will be Professor Mark Welland of the University of Cambridge, UK. His talk, entitled "What Microscopy Can Tell Us about Alzheimer's and Related Diseases," will feature extensive application of scanning probe techniques. Professor Welland's presentation will serve as an anchor for symposia in scanning probe microscopy in both biological and physical science. There will be an extensive surface science symposium that will feature many of the techniques that are complementary to scanning probe microscopy, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry. Secondary ion mass spectrometry, classically a technique limited to materials and geological sciences, has become a popular and extremely powerful technique in chemical mapping in biological systems as well. This year we will celebrate the accomplishments of George Palade with the Palade Memorial Symposium, for his work in microscopy that led him to determine the intricate inner workings of cells. And, as always, we will continue to feature several symposia that emphasize microscopy and microanalysis of materials in nanotechnology and advanced energy systems.

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