Problem Solving with SEM, X-Ray Microanalysis, and Electron Backscatter Patterns

For scientists, engineers, technicians, and technical managers who seek an intermediate/advanced course in the techniques of SEM, x-ray microanalysis, and electron backscatter diffraction (EBSD) applied to practical problem solving. High- resolution SEM, low-voltage SEM, variable-pressure SEM (environmental), crystallography by EBSD, x-ray spectrometry by EDS, silicon drift detectors (SDD) and WDS, digital image processing, and image/microanalysis modeling will be described in lectures and laboratories. BRING A SPECIMEN-SOLVE A PROBLEM! Students are encouraged to bring their own specimens and/or data such as SEM images (e.g., JPEG, TIFF formats), EDS x-ray spectra (export as MSA/MAS format), EBSD patterns, etc. These will be examined in small group laboratory sessions with problem solving discussions led by lecturers and laboratory demonstrators from the participating vendors. Software will be provided ( Monte Carlo simulation, image processing, electron/x-ray database).