This course is for SEM and microprobe operators and supervisors who wish to further advance their knowledge of x-ray microanalysis. Emphasis will be placed on the physical concepts and practical details required for successful quantitative analysis. Learn how to perform EDS and WDS microanalysis on bulk specimens, layered materials, particles and beam-sensitive materials. Master quantitative aspects including ZAF and F(?z) corrections. Discover emerging technologies such as silicon drift detectors, micro calorimeter EDS, and microanalysis in a variable pressure SEM. Computer-aided imaging and microanalysis will be introduced with special emphasis placed on the accuracy and reliability of automated analysis.

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