Electrochemical strain microscopy (ESM) is a novel scanning probe microscopy (SPM) technique available exclusively for the Cypher™ and MFP-3D™ atomic force microscopes (AFMs) from Asylum Research that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution. Only with understanding of electrochemical functionality on the level of individual nanoparticles or structural defects can practical, knowledge-driven energy storage research and development proceed.

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