Date: 12 December 2013, 4pm GMT / 5pm CET / 11am US EST
Duration: 1 hours
Atomic force microscopy (AFM) and Raman spectroscopy both provide complementary information about the surface of a sample: the former provides structural and topographic surface imaging on the nanometer scale, while the latter uses molecular vibrations to reveal chemical and morphological information about a material.
Combining AFM and Raman into an integrated solution enables multifaceted analysis of advanced materials, allowing for correlating chemical information with other physical, electrical, and magnetic properties with nanoscale resolution. The system is capable of both co-localized measurements and tip-enhanced Raman spectroscopy (TERS) which allows chemical resolution down to the tens or hundreds of nanometers scale.
The Thermo Scientific™ DXR™ Raman microscope and NT-MDT™ Ntegra™ atomic force microscope is a unique AFM-Raman solution, combining easy-to-use and reliable Raman with high performance AFM. Through both an optimized optical coupling and a simple and single control interface, this AFM-Raman approach allows researchers to focus on their materials rather than the instrumental technique. The system provides significant signal enhancement, detailed chemical /structural information, and nanoscale sample resolution that will allow researchers to achieve new insights about materials, quickly and confidently.
Why should I attend the webinar?
- Hear from expert speakers on surface probe and Raman microscopies
- Discover solutions for the analysis of graphene and other advanced materials including: Raman, co-localized Raman-AFM and TERS
Speakers
Dr. Mark H. Wall
Sr. Product Specialist, Thermo Fisher Scientific
Dr. Pavel Dorozhkin
Head of Applications and Product Management, NT-MDT
Dr Baptiste Gault (Moderator)
Materials Science Publisher