Scientists, engineers and production technicians seeking faster surface analysis with research-grade performance can now use a new instrument that is designed for the special requirements of a multi-user, x-ray photoelectron spectroscopy (XPS) laboratory.

The Thermo Scientific K-Alpha+ XPS spectrometer, an enhancement of the award-winning K-Alpha instrument, features PLUS detection technology, which improves count rates and offers better recognition of low concentration components, and faster chemical state resolution. Compact in design, this XPS instrument offers a cost-effective method for the surface analysis of metals, polymers, fabrics, composites, and many other solids.

“We designed the K-Alpha+ to give users of all experience levels access to the same performance more advanced scientists and researchers have come to expect,” said Kevin Fairfax, nanoscale materials analysis general manager, Thermo Fisher Scientific. “We believe this brings research-grade surface analysis to more labs and more users.”

The enhanced features of the K-Alpha+ spectrometer build upon a legacy of excellence, including the patented, dual-beam charge compensation system for the analysis and depth profiling of insulating samples such as powders and fibers. In addition, the K-Alpha+ instrument offers:

  • An optional MAGCIS dual-mode ion source, with new technology for profiling soft materials;
  • Industry-leading Thermo Scientific Avantage Data System software for instrument control, data acquisition, data processing and interpretation, and creating reports;
  • An innovative design that is ideal for labs requiring high throughput and reliability.

This story is reprinted from material from Thermo Fisher Scientific Inc., with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.