Atomic force microscopy (AFM) relies on an ultra sharp tip to interact with and physically measure a sample surface. The technology for the fabrication of AFM probe tips is undergoing rapid evolution with the application of new nanotechnology techniques. AFM probes with new qualities, advanced materials, and improved performance are becoming readily available. This new class of AFM probe tools has the potential to dramatically change scanning probe microscopy technology and techniques.

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DOI: 10.1016/S1369-7021(09)70276-7