Identifying vacancies using positron annihilation
Volume 3, Issue 1, Page 20–23
| M.R. Brozel
Intrinsic point defects exist in all semi-conducting materials. Their identification and measurement, however, require the use of specialist tools such as positron annihilation spectroscopy. This article explains the basics of the technique and describes some of its applications in compound semiconductor materials
Read full text on ScienceDirect
DOI: 10.1016/S1369-7021(00)80012-7
Share this journal article