Near-field Raman microscopy
Volume 8, Issue 5, Page 50–54
| Neil Anderson, Achim Hartschuh, Lukas Novotny
Near-field microscopy offers the power of optical characterization with nanometer spatial resolution (~15 nm). Combining tip-enhanced microscopy with Raman scattering spectroscopy results in the ability to localize distinct spectral features, providing a unique opportunity to characterize materials on length scales of a few nanometers using visible light.
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DOI: 10.1016/S1369-7021(05)00846-1
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