Sensing current and forces with SPM
Volume 13, Issue 10, Page 38–45
| Jeong Y. Park, Sabine Maier, Bas Hendriksen, Miquel Salmeron
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.
Read full text on ScienceDirect
DOI: 10.1016/S1369-7021(10)70185-1
Share this journal article