Devices and structures made on a nanoscale now have a number of real world applications, and the potential for further development and uptake is still growing. However, converting the latest ideas and designs into something real for research, testing and prototyping can pose a significant technical and financial barrier.

FEI offers a smart and efficient way of turning nanoscale designs into reality. Using finely focused particle beams along with state-of-the-art patterning engines and precision stages integrated into FEI’s latest focused ion beam (FIB), scanning electron microscopes (SEM) and DualBeams™ (combined FIB and SEM) offer an efficient way of turning nanoscale designs into reality.

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