Field emission scanning electron microscopy is standard technology for high resolution imaging and different contrasting methods aiming for a comprehensive characterization of specimens. A wide range of applications is covered by classical FE-SEM technology, including imaging surface sensitive and non-conductive samples without pre-treatment. The novel optical design of the Gemini column now delivers high contrast images at low voltage combined with excellent signal detection efficiency and signal-to-noise. Furthermore, an innovated concept for imaging at higher pressure ranges allows fast acquisition of crisp images in variable pressure mode with all the Inlens detectors known from high vacuum mode.
Researchers have used a new nanoscope to investigate light-controlled supercondcutors at extreme scales of space, time and energy.
A 3D model created by AI helped researchers to understand the formation of dislocations in complex polycrystalline materials.
Turning natural atomic flaws inside diamond anvils into quantum sensors offers a novel way to study the effects of pressure on materials.