Field emission scanning electron microscopy is standard technology for high resolution imaging and different contrasting methods aiming for a comprehensive characterization of specimens. A wide range of applications is covered by classical FE-SEM technology, including imaging surface sensitive and non-conductive samples without pre-treatment. The novel optical design of the Gemini column now delivers high contrast images at low voltage combined with excellent signal detection efficiency and signal-to-noise. Furthermore, an innovated concept for imaging at higher pressure ranges allows fast acquisition of crisp images in variable pressure mode with all the Inlens detectors known from high vacuum mode.

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