The latter mainly results from the desire to improve spatial resolution of bulk sample EDS analyses by reducing the accelerating voltage of the scanning electron microscope. Thanks to the efficiency and energy resolution of state-of-the-art EDS detectors, analysis of specimens at accelerating voltages of 5 kV or lower within reasonable time has become possible.
This webinar deals with quantitative EDS analysis out of the ordinary, meaning in such cases where automatisms fail. The intention is to provide information on the current possibilities and latest developments in quantitative analysis including numerous hints for our attendees how to deal with such challenges in their everyday work. Many applications will be demonstrated for illustration. During the webinar we will present the following content:
- Quantification steps
Which steps are necessary to obtain quantitative composition results from an EDS spectrum? This includes the development and testing of evaluation strategies for improved result quality. A focus will be on the deconvolution of overlapping element peaks.
- Standardless analysis of light element and low energy peaks
Bruker has recently completed the development of a new approach for the analysis of light elements and heavy element peaks at the lower end of the energy dispersive spectrum. We introduce this method and present respective analysis results.
- Standard-based quantification at low accelerating voltages
In cases of very low accelerating voltages standard-based quantification may be required. We show how reliable results can be obtained from SEM analyses at acceleration voltages even below 2 kV.
- Application examples from Anadolu University
Renowned Anadolu University from Eskisehir, Turkey present their latest results obtained from experiments in their materials science and engineering department. This includes analyses at very low energies and the solution of difficult peak overlap problems.