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Characterization CHANGE TOPIC

Characterization products, July 2013

JPK Instruments, announces the release of the next generation of NanoWizard® AFM systems.

Magritek reports on the use of their Spinsolve Benchtop NMR system at TU Delft, Netherlands, for the study of polymers

Arden Photonics offers customers a quicker and easier way of characterising laser beams to optimise their performance.

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