Our website uses cookies

Cookies enable us to provide the best experience possible and help us understand how visitors use our website. By browsing Materials Today, you agree to our use of cookies.

Okay, I understand Learn more
Characterization CHANGE TOPIC

Characterization products, January 2014

The stream-lined, fit-for-purpose design makes this small detector ideal for table-top SEMs.

Hamamatsu introduces a new spectrometer to the highly popular series of transmission grating (TG) based mini-spectrometers.

The new WITec Suite software is now available for all WITec imaging systems.

ZEISS Smartzoom 5 First Automated Digital Microscope - In an industrial environment, suited to conducting failure analyses.

HORIBA Scientific, is pleased to announce the release of three new scientific imaging cameras, e.g., EFiS, AToR and iRiS.

FEI announces the availability of the NanoEx™-i/v sample holder for atomic-resolution imaging at elevated temperatures and applied electrical bias.

TMC13 Deposition Rate Controller now supports Multi-Crystal sensors

New ATR accessory from Thermo Scientific enables cost effective analysis of materials and mixtures in minutes.

The German Lech-Stahlwerke GmbH works with a new test system from Institut Dr. Foerster GmbH & Co. KG.

Lake Shore’s new 8500 Series THz system is a fully integrated hardware/software platform.

The new Model 8407 Hall effect measurement system from Lake Shore Cryotronics.

Park Systems introduces automatic defect review for semiconductor wafers - an astounding 1,000% throughput increase.

NT-MDT proudly announces Titanium, the first AFM with a self-aligning, multiple probe cartridge for fast, automated tip exchange.

TESCAN ORSAY HOLDING, a.s., and WITec GmbH jointly launch the RISE Microscopy for Correlative Raman-SEM Imaging .

NanoWorld AG announced the commercialization of six types of Ultra-Short Cantilevers dedicated for use in High-Speed Atomic Force Microscopy.

Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997, announced PinPoint Conductive AFM.

The ease of use and excellent stability of the KL-AVP anti-vibration platform makes it ideal for microscope users who need to eliminate vibrations.

XploRA Plus is Perfect for use in multi-sample and multi-user research and analytical environments.

HORIBA Scientific is pleased to announce the launch of a new generation of phase modulation spectroscopic ellipsometer for VUV measurements.

The new Epsilon 3X instruments to deliver outstanding analytical performance right across the periodic table.

Phase Focus has announced a family of innovative phase microscopy systems for live cell imaging using the Phasefocus Virtual Lens.

The new ConfoGate CGM-100 optical portal system of confovis GmbH allows standardized roughness measurements for the first time.

Shimadzu's new EDX fluorescence spectrometers achieve precise, high-sensitivity analysis of a wide range of elements

New stylus profiler enables semi-automated measurements with uncompromised 300mm access.

New e-shutter offers exposures as short as 4 microseconds.

The newly developed focused ion beam (FIB) column enables fast and precise materials processing.

Raman imaging microscope designed to deliver rapid, research-grade imagery of molecular structures.

Sonoscan® has begun shipping its new Model DF2400™ in its FACTS2™ line of C-SAM® acoustic microscopes.

GL SPECTIS 5.0 from GL Optic is a compact portable spectrometer running an Android operating system for laboratory-grade characterisation of light sources.

Malvern reports on how NanoSight's Nanoparticle Tracking Analysis, NTA, is being applied in the Veterinary Research Institute, Brno, Czech Republic.

Connect with us
What’s coming up in characterization…
Webinar
 
25
Sep ’19

Webinar
 
20
Nov ’19