The new WITec Suite software is now available for all WITec imaging systems.
29 May 2014
ZEISS Smartzoom 5 First Automated Digital Microscope - In an industrial environment, suited to conducting failure analyses.
29 May 2014
HORIBA Scientific, is pleased to announce the release of three new scientific imaging cameras, e.g., EFiS, AToR and iRiS.
16 May 2014
FEI announces the availability of the NanoEx™-i/v sample holder for atomic-resolution imaging at elevated temperatures and applied electrical bias.
13 May 2014
TMC13 Deposition Rate Controller now supports Multi-Crystal sensors
7 May 2014
New ATR accessory from Thermo Scientific enables cost effective analysis of materials and mixtures in minutes.
2 May 2014
The German Lech-Stahlwerke GmbH works with a new test system from Institut Dr. Foerster GmbH & Co. KG.
28 April 2014
Lake Shore’s new 8500 Series THz system is a fully integrated hardware/software platform.
11 April 2014
The new Model 8407 Hall effect measurement system from Lake Shore Cryotronics.
11 April 2014
Park Systems introduces automatic defect review for semiconductor wafers - an astounding 1,000% throughput increase.
3 April 2014
NT-MDT proudly announces Titanium, the first AFM with a self-aligning, multiple probe cartridge for fast, automated tip exchange.
1 April 2014
TESCAN ORSAY HOLDING, a.s., and WITec GmbH jointly launch the RISE Microscopy for Correlative Raman-SEM Imaging .
27 March 2014
NanoWorld AG announced the commercialization of six types of Ultra-Short Cantilevers dedicated for use in High-Speed Atomic Force Microscopy.
14 March 2014
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997, announced PinPoint Conductive AFM.
6 March 2014
The ease of use and excellent stability of the KL-AVP anti-vibration platform makes it ideal for microscope users who need to eliminate vibrations.
4 March 2014
XploRA Plus is Perfect for use in multi-sample and multi-user research and analytical environments.
4 March 2014
HORIBA Scientific is pleased to announce the launch of a new generation of phase modulation spectroscopic ellipsometer for VUV measurements.
19 February 2014
The new Epsilon 3X instruments to deliver outstanding analytical performance right across the periodic table.
12 February 2014
Phase Focus has announced a family of innovative phase microscopy systems for live cell imaging using the Phasefocus Virtual Lens.
4 February 2014
The new ConfoGate CGM-100 optical portal system of confovis GmbH allows standardized roughness measurements for the first time.
3 February 2014
Shimadzu's new EDX fluorescence spectrometers achieve precise, high-sensitivity analysis of a wide range of elements
30 January 2014
New e-shutter offers exposures as short as 4 microseconds.
30 January 2014
New stylus profiler enables semi-automated measurements with uncompromised 300mm access.
30 January 2014
The newly developed focused ion beam (FIB) column enables fast and precise materials processing.
29 January 2014
Raman imaging microscope designed to deliver rapid, research-grade imagery of molecular structures.
22 January 2014
Sonoscan® has begun shipping its new Model DF2400™ in its FACTS2™ line of C-SAM® acoustic microscopes.
16 January 2014
GL SPECTIS 5.0 from GL Optic is a compact portable spectrometer running an Android operating system for laboratory-grade characterisation of light sources.
16 January 2014
Malvern reports on how NanoSight's Nanoparticle Tracking Analysis, NTA, is being applied in the Veterinary Research Institute, Brno, Czech Republic.
7 January 2014