Characterization products, July 2014

The cathodoluminescence revolution goes 3D

XEI Scientific launches the revolutionary Evactron EP plasma cleaning system

XEI Scientific launches the Evactron EP plasma cleaning system for physicists and materials scientists who build and use their own vacuum systems.

Enhancements to Thermo Scientific Nicolet iN10 FT-IR microscope provide sharp visual imagery

Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers

Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers.

Version 5 software released for particle sizer

The new version 5 software has been released for the XO in-process particle size analysis range from Xoptix Ltd.

Versatile new AC resistance bridge for precise, ultra-low temperature control

The new Lake Shore Model 372 AC resistance bridge and temperature controller makes it easy to perform multiple tasks at very low temperatures.

FEI releases new Helios NanoLab G3 DualBeam

FEI announces the release of the next generation of its industry-leading Helios NanoLab™ DualBeam™

Monolithic diamond ATR accessory offers rapid, detailed sample analysis

Laboratories that provide QA/QC, forensics, educational or analytical services can now use a new monolithic diamond accessory at an affordable price.

New molecular motion tracking mode for Nano-Cyte®

The Nano-Cyte® Single Molecule Imaging system now features a “tracking” mode capable of surveying a wide sample area.

CAMECA launches next generation atom probe microscope

New LEAP® 5000 delivers 3D Sub-Nanometer analytical performance across a wide variety of metals, semiconductors and insulators.

Bruker launches unique software package for dynamical EBSD pattern simulation

FEI unveils new solutions for faster time-to-analysis in metals research

FEI announced two new products that speed up the imaging and analysis time for metals researchers and industrial failure analysis labs.

Monolithic diamond ATR accessory offers rapid, detailed sample analysis

Laboratories can now use a new monolithic diamond accessory designed to perform fast, high-quality attenuated total reflectance (ATR) sample analysis.

Park NX-Wafer designed for wafer-fab manufacturing

Park Systems announces Park NX-Wafer, a revolutionary AFM design for bare wafer manufacturing.

Spectra-Physics® Launches High Energy, One-Box Ultrafast Amplifiers

New Solstice Ace delivers industry-leading >6 mJ energy, >7 W power with ultrashort <35 fs pulses.

Phosphorus-31 capable benchtop NMR spectroscopy system

Magritek announces Spinsolve Phosphorus, the world’s first Phosphorus-31 capable benchtop NMR spectroscopy system.

Lensless imaging breakthrough with table-top soft-X-ray source promises laboratory-friendly ultra-high resolution microscopy

High sensitivity of Andor iKon-L SO high energy detection camera key.

MEMS wafer inspection system

Sonoscan has announced its AW322 200™ fully automated system for ultrasonic inspection of MEMS wafers.

Leica Microsystems Releases Leica Application Suite Advanced Fluorescence (LAS AF) 4.0

Image analysis, environmental control and experiment handling via mobile devices for life science research.

Epsilon 3X automation for flexible and safe process control

Epsilon 3X automation, PANalytical combines the advantages of a benchtop X-ray fluorescence (XRF) spectrometer with an automation environment.