Technical partnership at the top – Oxford Instruments and Zurich Instruments announce a technical collaboration for low temperature physics

Oxford Instruments (OI), and Zurich Instruments (ZI), have announced their joint technical collaboration primarily focused on demonstrating how the efficiency of combining equipment from both companies results in reduced time between installation and measurement. The collaboration will yield a series of joint application notes featuring low temperature measurement techniques and applications. The two companies will also exchange technical expertise in order to improve their customer support for the low temperature community.

Both companies are devoted to the objective of managing the increasing complexity and costs of low temperature research. “This collaboration continues to demonstrate the versatility of Oxford Instruments’ OptistatDry Cryofree® cryostat for optical and electrical applications. Our customers' demands for streamlined experiments and the joint demonstrations with ZI equipment provide the evidence for faster and more accurate measurements taken in less time,” said Dr Michael Cuthbert, Managing Director at Oxford Instruments Nanoscience. The OptistatDry comprises a range of compact cryostats with outstanding optical access, fast set-up and fast sample change, cooled by a closed cycle refrigerator.

“Our lock-in amplifiers are designed for efficient and effective measurements. The high-end features and usability that we have developed for our instruments are now, with the MFLI lock-in amplifiers, available for low and medium frequencies”, said Sadik Hafizovic, CEO of Zurich Instruments. Covering the frequency range between DC and 500 kHz or, alternatively, up to 5 MHz, the MFLI ideally targets low temperature communities providing signal generation and measurement analysis all within its LabOne© software environment, resulting in an improved understanding of the signal quality during the course of their measurements.

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This story is reprinted from material from Oxford Instruments NanoScience, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.