In this webinar we will describe the multiscale 3D workflows that combine macroscale X-ray computed tomography (CT), micro X-ray CT, nanoscale serial section FIB/SEM imaging and analysis, and scanning transmission electron microscopy (S/TEM) to study a range of materials. This approach allows us to travel through length scales to better understand the direct link between properties and the underlying microstructure and to co-visualize structural, crystallographic and chemical information.
Speakers
Philip J. Withers, Professor of Materials Science, University of Manchester
Pascal Doux, Product Director / FEI Company, Visualization Sciences Group
Baptiste Gault (Moderator), Materials Science Publisher