Image Credit: PI
Image Credit: PI

Motion and precision positioning systems industry expert PI (Physik Instrumente) L.P. introduces a new compact linear stage – the L-509. Providing high precision linear motion with minimized runout, this positioner delivers performance and reliability at minimized cost. It has applications in research and industrial applications, including beamline systems, microscopy, semiconductor manufacturing, and photonics instrumentation.

High Travel Accuracy, Up to >20 lb Payload

Despite its compact dimensions, the stage can handle payloads of more than 20 lbs. Available with travel ranges of 26mm (1”), 52mm (2”), and 102mm (4”) and velocity to 20mm/sec, the L-509 delivers high accuracy and smooth motion with unidirectional repeatability down to 0.1 microns. Long service life and excellent guiding accuracy with minimum backlash are guaranteed by the precision crossed roller bearings with anti-creep cage assist. For the highest precision requirements, a linear encoder with 1 nanometer resolution is available.

What Drives It?

A compact DC servo motor with gearhead is offered for high torques and resolution, while a 2-phase direct-drive stepper motor delivers higher velocity. Encoder options include an integrated rotary sensor mounted on the motor shaft and the above mentioned integrated linear version that provides direct position measurement not influenced by mechanical play or hysteresis in the drive train.

Noncontact, optical limit switches and reference point switches with direction sensing in the middle of the travel range simplify use in automation tasks.

For specifications, datasheet and more information please visit: http://www.pi-usa.us/products/precision_positioning_pi-micos/Linear_Precision_Positioning_Stages_Mc.php#High_Precision

 

Contact Information:

USA / Canada

http://www.pi-usa.us | info@pi-usa.us

East         

(508) 832-3456

Midwest             

(508) 832-3456

West    

(949) 679-9191 (LA Area & Mexico)

(408) 533-0973 (Silicon Valley/Bay Area)

 

This story is reprinted from material from Physik Instrumente, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.