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Crystalline CHANGE TOPIC

Crystalline materials products, January 2014

The stream-lined, fit-for-purpose design makes this small detector ideal for table-top SEMs.

FEI announces the availability of the NanoEx™-i/v sample holder for atomic-resolution imaging at elevated temperatures and applied electrical bias.

New ATR accessory from Thermo Scientific enables cost effective analysis of materials and mixtures in minutes.

Park Systems introduces automatic defect review for semiconductor wafers - an astounding 1,000% throughput increase.

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Materials Today Interview with Lindsay Chapman from the National Physical Laboratory in the UK about thermal analysis.

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