Electronic CHANGE TOPIC

Electronic properties journal articles, Volume 22 (January–February 2019)

Here you will find articles from the flagship Materials Today journal. For articles and information on all the journals in the Materials Today family, including details on how to submit articles, visit the Journals page. To browse and search the whole collection of articles directly, please visit ScienceDirect.

Current research
 

Volume 22, Pages 17–24Chenglu Liang, Jingjie Wu, Sreekanth J. Varma, Yusuke Nakanishi, Amir Aliyan, Angel A. Martí, Yan Wang, Banghu Xie, Jitesh Kumar, Katherine Layne, Nitin Chopra, Ihab Odeh, Robert Vajtai, Jayan Thomas, Xiangfang Peng, Wei Yang, Pulickel M. Ajayan
Current research
 

Volume 22, Pages 25–34Raphael Engesser, Kathrin Ermes, Christian Geraths, Jens Timmer, Wilfried Weber
Current research
 

Volume 22, Pages 50–57Dennis W. McOwen, Lei Zhang, Zhaohui Ma, Zhezhen Fu, Yang Wen, Yunhui Gong, Jiaqi Dai, Tanner R. Hamann, Liangbing Hu, Eric D. Wachsman
Current research
 

Volume 22, Pages 58–66Solomiya Paryzhak, Kostiantyn Turcheniuk, Tetiana Dumych, Alexandre Barras, Rabah Boukherroub, Fujia Wang, Gleb Yushin, Sabine Szunerits
Current research
 

Volume 22, Pages 67–75Yunxia Zhang, Zhou Yang, Jiangshan Feng, Zhuo Xu, Qingxian Li, Mingxin Hu, Haochen Ye, Xu Zhang, Ming Liu, Kui Zhao, Shengzhong(Frank) Liu
Current research
 

Volume 22, Pages 76–84Mi Fei, Jie Chen, Yunfei Tian, Yang Jiang, Yang Huang, Kai Xu, Juntao Hu, Zhi Zhao, Qiuhong Zhang, Haiyong Ni, Lei Chen
Current research
 

Volume 22, Pages 85–107Alex Matos-Abiague, Benedikt Scharf, Hanan Dery, Kirill Belashchenko
Current research
 

Volume 22, Pages 132–141Richard J. Miron

Journal articles archive…

Connect with us
Most viewed in electronic properties…
Current research
 

Volume 21, Issue 8, Pages 825–833JohannesWandt, Anna T.S.Freiberg, AlexanderOgrodnik, Hubert A.Gasteiger
News
 

A thin layer of fullerene molecules allows electrons to travel further than previously thought possible in organic solar cells and organic semiconductors.

1 February 2018
News
 

Scientists have developed a fast, non-destructive optical method for analyzing defects in 2D materials

18 May 2017
Review
 

Volume 19, Issue 6, Pages 349–362Y.F. Ye, Q. Wang, J. Lu, C.T. Liu, Y. Yang
Feature
 

Read Yury Gogotsi's responses to his webinar: MXenes: a new family of two-dimensional materials.

10 November 2014Zara Preston