28th International Conference on Defects in Semiconductors

The 28th International Conference on Defects in Semiconductors 2015 will be organized in Espoo, Finland, from the 27th to the 31st of July 2015.

The tutorial day will be organized on the 25th of July 2015.

The conference will focus on fundamental properties and applications of electrically, optically and magnetically active point and extended defects in materials for micro- and optoelectronics, spintronics, photovoltaics, etc. These include organic semiconductors, oxides, topological materials, both in bulk crystal and thin film forms as well as low-dimensional and nanoscale structures.