New Jersey-based EDAX Inc., a leader in micro X-ray fluorescence, has introduced its X-ray coating analysis software for the Orbis micro-XRF elemental analyser system. Using the coating analysis software, the Orbis provides simultaneous multi-layer film thickness and composition analyses for metal, oxide, nitride and carbide coatings, as well as coatings that contain elements within the observable range of the Orbis system from Sodium to Berkelium. 

Typical applications include analysis of electrical contact coatings for electronics, magnetic media and semiconductors; anti-corrosion and wear coatings for fasteners, aerospace and automotive components; and RoHS analysis of solder coatings.

The Orbis coating analysis software is based on EDAX’s patented fundamental parameter software for bulk quantification. The software has the ability to measure thicknesses in the range from 1nm to 50mm for up to five layers with 10 elements in each layer. Result reporting is consistent with EN ISO 3497 and ASTM B568.

New Jersey-based EDAX Inc., a leader in micro X-ray fluorescence, has introduced its X-ray coating analysis software for the Orbis micro-XRF elemental analyser system. Using the coating analysis software, the Orbis provides simultaneous multi-layer film thickness and composition analyses for metal, oxide, nitride and carbide coatings as well as coatings that contain elements within the observable range of the Orbis system from Sodium to Berkelium.

Typical applications include analysis of electrical contact coatings for electronics, magnetic media and semiconductors; anti-corrosion and wear coatings for fasteners, aerospace and automotive components; and RoHS analysis of solder coatings.

The Orbis coating analysis software is based on EDAX’s patented fundamental parameter software for bulk quantification. The software has the ability to measure thicknesses in the range from 1nm to 50mm for up to five layers with 10 elements in each layer. Result reporting is consistent with EN ISO 3497 and ASTM B568.