As well as exhibiting, Malvern is also contributing five short courses, covering particle and nanoparticle size analysis, chromatography, optical rheology and zeta potential measurement.
As well as exhibiting, Malvern is also contributing five short courses, covering particle and nanoparticle size analysis, chromatography, optical rheology and zeta potential measurement.

Visitors can also look at nanoparticle characterization with the Zetasizer Nano and NanoSight Nanoparticle Tracking Analysis (NTA) systems, and morphological and chemical characterization with the Morphologi G3-ID, also the subject of a conference presentation.

As well as exhibiting, Malvern is also contributing five short courses, covering topics that include particle and nanoparticle size analysis, gel permeation/size exclusion chromatography, optical rheology and zeta potential measurement. In addition, work using Malvern’s Morphologi G3-ID particle characterization system will be described in “Forensic Analyses by Morphologically Directed Raman Spectroscopy”, a presentation from researchers at the University of New Haven, which forms part of the conference session ”Techniques in Forensic Analysis”.