FEI announces the availability of the NanoEx™-i/v sample holder for atomic-resolution imaging at elevated temperatures and applied electrical bias.
The German Lech-Stahlwerke GmbH works with a new test system from Institut Dr. Foerster GmbH & Co. KG.
Sonoscan® has begun shipping its new Model DF2400™ in its FACTS2™ line of C-SAM® acoustic microscopes.