In this Application Note, a multi-scale study of the LiMn2O4 cathode material of a commercial 18650 lithium ion
battery is presented. X-ray microscopy (XRM) measurements of the cathode reveal unexpected features which
motivate more detailed analysis in the FIB-SEM. 

These features of interest are sparse and located at random locations well below the sample surface. In a correlative approach, the XRM data set is used as a reference to make site-specific FIB cross sectioning and tomography possible.

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