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Frequent and cost effective spectroscopic characterization is important in the development of competitive optical thin film coatings. Fully automated and unattended spectroscopic measurements can help reduce costper-analysis, increase productivity, and help expand quality assurance programs. In the manufacturing process, large, usually circular substrate wafers are coated in deposition chambers that usually operate at full capacity. An efficient and productive optical characterization tool needs to deliver accurate and meaningful information at user-defined points across the surface of the wafer before it is cut. The Agilent Solids Autosampler, 

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