XEI Scientific launches the Evactron EP plasma cleaning system for physicists and materials scientists who build and use their own vacuum systems.
10 November 2014
Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers.
9 October 2014
The new version 5 software has been released for the XO in-process particle size analysis range from Xoptix Ltd.
19 September 2014
The new Lake Shore Model 372 AC resistance bridge and temperature controller makes it easy to perform multiple tasks at very low temperatures.
4 September 2014
FEI announces the release of the next generation of its industry-leading Helios NanoLab™ DualBeam™
4 September 2014
Smit Röntgen opens doors for large volume industrial manufacturing of 3D printed pure Tungsten parts.
1 September 2014
Laboratories that provide QA/QC, forensics, educational or analytical services can now use a new monolithic diamond accessory at an affordable price.
15 August 2014
The Nano-Cyte® Single Molecule Imaging system now features a “tracking” mode capable of surveying a wide sample area.
14 August 2014
New LEAP® 5000 delivers 3D Sub-Nanometer analytical performance across a wide variety of metals, semiconductors and insulators.
6 August 2014
FEI announced two new products that speed up the imaging and analysis time for metals researchers and industrial failure analysis labs.
4 August 2014
Laboratories can now use a new monolithic diamond accessory designed to perform fast, high-quality attenuated total reflectance (ATR) sample analysis.
18 July 2014
Park Systems announces Park NX-Wafer, a revolutionary AFM design for bare wafer manufacturing.
18 July 2014
New Solstice Ace delivers industry-leading >6 mJ energy, >7 W power with ultrashort <35 fs pulses.
15 July 2014
Magritek announces Spinsolve Phosphorus, the world’s first Phosphorus-31 capable benchtop NMR spectroscopy system.
15 July 2014
Thermo Scientific K-Alpha+ offers scientists affordable access to advanced technology for studying cutting-edge materials
8 July 2014
High sensitivity of Andor iKon-L SO high energy detection camera key.
8 July 2014
Sonoscan has announced its AW322 200™ fully automated system for ultrasonic inspection of MEMS wafers.
8 July 2014
Image analysis, environmental control and experiment handling via mobile devices for life science research.
8 July 2014
Smart productivity, smart operation and smart performance for everyday laboratory use.
8 July 2014
Epsilon 3X automation, PANalytical combines the advantages of a benchtop X-ray fluorescence (XRF) spectrometer with an automation environment.
8 July 2014