FEI announces the availability of the NanoEx™-i/v sample holder for atomic-resolution imaging at elevated temperatures and applied electrical bias.
13 May 2014
TMC13 Deposition Rate Controller now supports Multi-Crystal sensors
7 May 2014
NT-MDT proudly announces Titanium, the first AFM with a self-aligning, multiple probe cartridge for fast, automated tip exchange.
1 April 2014
TESCAN ORSAY HOLDING, a.s., and WITec GmbH jointly launch the RISE Microscopy for Correlative Raman-SEM Imaging .
27 March 2014
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997, announced PinPoint Conductive AFM.
6 March 2014
The ease of use and excellent stability of the KL-AVP anti-vibration platform makes it ideal for microscope users who need to eliminate vibrations.
4 March 2014
HORIBA Scientific is pleased to announce the launch of a new generation of phase modulation spectroscopic ellipsometer for VUV measurements.
19 February 2014
The new ConfoGate CGM-100 optical portal system of confovis GmbH allows standardized roughness measurements for the first time.
3 February 2014
New stylus profiler enables semi-automated measurements with uncompromised 300mm access.
30 January 2014
The newly developed focused ion beam (FIB) column enables fast and precise materials processing.
29 January 2014