XEI Scientific launches the Evactron EP plasma cleaning system for physicists and materials scientists who build and use their own vacuum systems.
10 November 2014
Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers.
9 October 2014
FEI announces the release of the next generation of its industry-leading Helios NanoLab™ DualBeam™
4 September 2014
Laboratories that provide QA/QC, forensics, educational or analytical services can now use a new monolithic diamond accessory at an affordable price.
15 August 2014
New LEAP® 5000 delivers 3D Sub-Nanometer analytical performance across a wide variety of metals, semiconductors and insulators.
6 August 2014
FEI announced two new products that speed up the imaging and analysis time for metals researchers and industrial failure analysis labs.
4 August 2014
Laboratories can now use a new monolithic diamond accessory designed to perform fast, high-quality attenuated total reflectance (ATR) sample analysis.
18 July 2014
Park Systems announces Park NX-Wafer, a revolutionary AFM design for bare wafer manufacturing.
18 July 2014
Image analysis, environmental control and experiment handling via mobile devices for life science research.
8 July 2014