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Surface science products, July 2014

XEI Scientific launches the Evactron EP plasma cleaning system for physicists and materials scientists who build and use their own vacuum systems.

Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers.

FEI announces the release of the next generation of its industry-leading Helios NanoLab™ DualBeam™

Laboratories that provide QA/QC, forensics, educational or analytical services can now use a new monolithic diamond accessory at an affordable price.

New LEAP® 5000 delivers 3D Sub-Nanometer analytical performance across a wide variety of metals, semiconductors and insulators.

FEI announced two new products that speed up the imaging and analysis time for metals researchers and industrial failure analysis labs.

Laboratories can now use a new monolithic diamond accessory designed to perform fast, high-quality attenuated total reflectance (ATR) sample analysis.

Park Systems announces Park NX-Wafer, a revolutionary AFM design for bare wafer manufacturing.

Image analysis, environmental control and experiment handling via mobile devices for life science research.

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Jun ’20