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Electronic properties features, January 2015

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28 May 2015T. Lowe, R.S. Bradley, S. Yue, K. Barii, J. Gelb, N. Rohbeck, J. Turner, P.J. Withers

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27 May 2015Rebecca Saive, Lars Mueller, Eric Mankel, Wolfgang Kowalsky, Michael Kroeger

Q&A of the very popular webinar from Edax: Past, present and future - the evolution of x-ray analysis.

11 March 2015Zara Preston

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14 January 2015Pablo Rivero, Víctor Manuel García-Suárez, David Pereñiguez, Kainen Utt, Yurong Yang, Laurent Bellaiche, Kyungwha Park, Jaime Ferrer, Salvador Barraza-Lopez
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