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Tip-enhanced near-field optical microscopy has become a valuable method for nanoscale materials characterization, which enables optical spectroscopies to be performed with nanoscale spatial resolution, beyond the diffraction limit. At infrared frequencies, scattering-type scanning near-field optical microscopy (s-SNOM) based on field-enhancement at the apex of sharp metal tips enables, for example, the nanoscale mapping of free carriers in transistors and semiconductor nanowires, of the chemical compositions of polymers and biological objects, of strain in ceramics, and of plasmons in graphene.
s-SNOM typically employs standard metal-coated atomic force microscope (AFM) tips, which are not optimized for optical and infrared imaging. In this webinar, we will report the fabrication of infrared-resonant antenna probes using FIB/SEM (Helios NanoLab DualBeam) and validate their function by electron energy loss spectroscopy (EELS), Fourier transform infrared spectroscopy (FTIR) and nanoscale topograpy and infrared imaging s-SNOM. We will review the fabrication steps of the antennas and describe how their length can be controlled to tune their resonance.
Additional insights into the range of 3D functional nanodevices that can be rapidly fabricated using FIB/SEM will be provided.
Why should I attend the webinar?
- Hear from expert speakers on near-field optical microscopy and focused ion beam nanofabrication experts
- Discover solutions for rapidly fabricating 3D nanodevices using FIB/SEM
- Find out information on recent FIB /SEM developments for nanofabrication
- Discuss your nanofabrication applications with experts
Rainer Hillenbrand, Ikerbasque Research Professor and Group Leader at CIC nanoGUNE
Laurent Roussel, Product Marketing Manager SEM/DualBeam, FEI
Baptiste Gault (Moderator), Materials Science Publisher