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Register for a free webinar presented by Prof Jeffrey C. Grossman, MIT.
This webinar will explore the powerful capabilities of today’s atomic force microscopes (AFMs) for characterizing thin films.
In this webinar, we will present examples of multilayer characterization using novel “high magnification” optics to provide enhanced spatial resolution.
Free webinar on x-ray analysis.
Register for this free webinar on non-destructive surface analysis by handheld FTIR.
energy efficient process uses bacteria to produce bone-like porous CaCO3-based composites