Nanomaterials products

Recent developments in the Raman microscope range at WITec

Nanomechanics introduces remote video option for iNano

The iNano nanoindenter now offers a Remote Video Option upgrade, giving labs a new window on materials testing.

Highly Dynamic XY Linear Motor Scanning Stage, Introduced by PI

Versatile, high precision near field scanning optical microscope

Versatile, high precision near field scanning optical microscope

Mad City Labs announces the release of MCL-NSOM, a versatile near field scanning optical microscope (NSOM).

Renishaw launches the new inVia™ Qontor™ confocal Raman microscope

Technical partnership at the top – Oxford Instruments and Zurich Instruments announce a technical collaboration for low temperature physics

Oxford Instruments’ Triton Cryofree dilution refrigerator

Rice University boots up powerful microscopes

New Lake Shore Model 372 firmware for enhanced low temperature measurements

More frequencies, sensor calibration curve interpolation added to AC resistance bridge/controller.

Oxford Instruments introduces innovative product for SEM-based particle analysis

Professional AFM images with a three step click SmartScan by Park Systems

Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers

Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers.

CAMECA launches next generation atom probe microscope

New LEAP® 5000 delivers 3D Sub-Nanometer analytical performance across a wide variety of metals, semiconductors and insulators.

Park Systems introduces its next generation NX-PTR

Park Systems Collaborates with Semiconductor’s Leading Hard Disc Drive Manufacturers to Develop its next generation NX-PTR.

Intelligent tool for optical inspection: Launch of ZEISS Smartzoom 5

ZEISS Smartzoom 5 First Automated Digital Microscope - In an industrial environment, suited to conducting failure analyses.

NanoWorld AG introduces ultra-short cantilevers for high-speed atomic force microscopy (HS-AFM)

NanoWorld AG announced the commercialization of six types of Ultra-Short Cantilevers dedicated for use in High-Speed Atomic Force Microscopy.

Park Systems new AFM technology surpasses old standards for semiconductor analysis

Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997, announced PinPoint Conductive AFM.