The iNano nanoindenter now offers a Remote Video Option upgrade, giving labs a new window on materials testing.
23 March 2016
Mad City Labs announces the release of MCL-NSOM, a versatile near field scanning optical microscope (NSOM).
15 March 2016
More frequencies, sensor calibration curve interpolation added to AC resistance bridge/controller.
8 June 2015
Thermo Scientific TGA-IR module enhances materials characterization for users of Thermo Scientific FT-IR spectrometers.
9 October 2014
New LEAP® 5000 delivers 3D Sub-Nanometer analytical performance across a wide variety of metals, semiconductors and insulators.
6 August 2014
Park Systems Collaborates with Semiconductor’s Leading Hard Disc Drive Manufacturers to Develop its next generation NX-PTR.
2 June 2014
ZEISS Smartzoom 5 First Automated Digital Microscope - In an industrial environment, suited to conducting failure analyses.
29 May 2014
NanoWorld AG announced the commercialization of six types of Ultra-Short Cantilevers dedicated for use in High-Speed Atomic Force Microscopy.
14 March 2014
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997, announced PinPoint Conductive AFM.
6 March 2014