Characterization products

Get to Know Proteus® at K 2016

Find out more about this product, here.

Recent developments in the Raman microscope range at WITec

RISE correlative Microscopy now compatible with ZEISS SEM Systems

JPK StretchingStage for AFM - Investigation of sample property changes under mechanical load

Versatile, high precision near field scanning optical microscope

Mad City Labs announces the release of MCL-NSOM, a versatile near field scanning optical microscope (NSOM).

Technical partnership at the top – Oxford Instruments and Zurich Instruments announce a technical collaboration for low temperature physics

Oxford Instruments’ Triton Cryofree dilution refrigerator

Nanolab technologies leaps forward with high-performance analysis Services to the world

New process chemistry technology allows automated lab reactor control

Rice University boots up powerful microscopes

New Lake Shore Model 372 firmware for enhanced low temperature measurements

More frequencies, sensor calibration curve interpolation added to AC resistance bridge/controller.

Hamamatsu develops a new wide dynamic range PMT module

Park Systems introduces park NX-Hivac

Tiny low-cost spectral sensor from Ocean Optics suited to OEM integration and benchtop use

Multiple X-ray technologies integrated for first time in groundbreaking Zetium spectrometer from PANalytical

New linear CCD image sensor

HORIBA Scientific introduces new back and front illuminated synapse EM CCD camera

HORIBA Scientific launched its new Synapse EM, a deep cooled EMCCD Scientific camera for low light and ultra-fast spectroscopy experiments.

Oxford Instruments introduces innovative product for SEM-based particle analysis