Atomic force microscopy (AFM) and Raman spectroscopy both provide complementary information about the surface of a sample. The Thermo Scientific™ DXR™ Raman microscope and NT-MDT™ Ntegra™ atomic force microscope is a unique AFM-Raman solution, combining easy-to-use and reliable Raman with high performance AFM. Through both an optimized optical coupling and a simple and single control interface, this AFM-Raman approach allows researchers to focus on their materials rather than the instrumental technique.
Mark H. Wall, Sr. Product Specialist, Thermo Fisher Scientific Contact Mark here Pavel Dorozhkin, Head of Applications and Product Management, NT-MDT Contact Pavel here Baptiste Gault (Moderator), Materials Science Publisher
A novel material made up of layers of different oxides, termed a gradient ENZ material, can beam thermal radiation at specific angles.
Using an advanced imaging technique, researchers have mapped, for the first time ever, the 3D atomic coordinates of medium- and high-entropy alloys.
New members of the family now in press
Now open for Original Research and Review article submission.