Asylum Research’s Contact Resonance Viscoelastic Mapping Mode option for
the MFP-3D™ and Cypher™ S atomic force microscopes (AFMs) enables
high resolution, quantitative imaging of both elastic storage modulus and
viscoelastic loss modulus. It is just one of the many nanomechanical tools in
Asylum’s NanomechPro™ Toolkit. The contact resonance technique is
particularly well suited for characterizing moderate to high modulus materials
in the range of about 1GPa to 200GPa. Thanks to recent advances by Asylum
and our collaborators, Contact Resonance Viscoelastic Mapping Mode is now
faster, more quantitative, and easier to use than earlier implementations.

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