The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
The journal encourages contributions in the general area of atomic, molecular, ionic, liquid and solid state spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation, Free Electron Lasers, laboratory lasers or other sources of ionizing radiation, combined with electron velocity analysis are especially welcome. The materials properties addressed include characterization of ground and excited state properties as well as time resolved electron dynamics.
The individual techniques of electron spectroscopy include photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; time resolved 2-photon photoemission, resonant and non-resonant Auger spectroscopy including ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) , resonant and non-resonant inelastic X-ray scattering (RIXS), spectro-microscopy, high resolution electron energy loss spectroscopy; electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy including scanning tunneling spectroscopy; theoretical treatments of the photoemission, X-ray emission, Auger, energy loss and Penning ionization processes. Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.
Subject areas covered include spectroscopic characterization of materials and processes concerning:
- surfaces, interfaces, and thin films;
- atomic and molecular physics, clusters;
- semiconductor physics and chemistry;
- materials for photovoltaics;
- materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated systems, polymers, biomaterials and other organic films;
- catalysis
Editorial board
Editors
- W. Eberhardt
Center for Free Electron Laser Science, Notkestraße 85, 22607, Hamburg, Germany - A.P. Hitchcock
McMaster University Brockhouse Institute for Materials Research Department of Chemistry and Chemical Biology, 1280 Main St.,, Hamilton, L8S 4M1, Ontario, Canada, Fax: +1-905-5212773 - N. Kosugi
Institute for Molecular Science, Nishigo-Naka 38, Myodaiji, 444-8585, Okazaki, Japan, Fax: +81-564-54-2254
Honorary Board
- C.R. Brundle
, California, United States of America - G.E. McGuire
Research Triangle Park, North Carolina, United States of America - T. Ohta
Kyoto, Japan - J.-J. Pireaux
Namur, Belgium
Editorial Board
- H.W. Ade
NC State University, Raleigh, North Carolina, United States of America - P.S. Bagus
University of North Texas, Denton, Texas, United States of America - H. Ebert
Ludwig Maximilians University Munich, Munich, Germany - D. Feng PhD
University of Science and Technology of China, Hefei, Anhui, China - X. Gao
Shanghai Institute of Applied Physics Chinese Academy of Sciences, Shanghai, China - M. Grioni
Federal Polytechnic School of Lausanne, Lausanne, Switzerland - F.M.F. de Groot PhD
Utrecht University Organic Chemistry and Catalysis, Utrecht, Netherlands - U. Hergenhahn
Max Planck Institute of Plasma Physics Greifswald Branch, Greifswald, Germany - D.-J. Huang
National Synchrotron Radiation Research Center, Hsinchu, Taiwan - S. Kera
Institute for Molecular Science, Okazaki, Japan - A. Kimura
Hiroshima University, Hiroshima, Japan - K.T. Leung
University of Waterloo, Waterloo, Ontario, Canada - T. Matsushita Ph.D.
Nara Institute Of Science And Technology Graduate School of Materials Science, Ikoma, Japan - C. Miron
SOLEIL, Gif sur Yvette, France - S. Molodtsov
European XFEL GmbH, Schenefeld, Germany - A. Naves de Brito
State University of Campinas, Campinas, São Paulo, Brazil - D. Prendergast
E O Lawrence Berkeley National Laboratory, Berkeley, California, United States of America - D.D. Sarma
Indian Institute of Science, Bengaluru, India - T. Schmitt
Paul Scherrer Institute, Villigen, Switzerland - S. Suzer
Bilkent University, Ankara, Turkey - M. Vos
Australian National University, Canberra, Australia - P. Weightman
University of Liverpool, Liverpool, United Kingdom - W. Werner
TU Wien University, Vienna, Austria - H.W. Yeom
Pohang University of Science and Technology, Pohang, South Korea - M. Zharnikov
Heidelberg University, Heidelberg, Germany