The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.

The journal encourages contributions in the general area of atomic, molecular, ionic, liquid and solid state spectroscopy carried out using electron impact, synchrotron radiation (including free electron lasers) and short wavelength lasers. Papers using photoemission and other techniques, in which synchrotron radiation, Free Electron Lasers, laboratory lasers or other sources of ionizing radiation, combined with electron velocity analysis are especially welcome. The materials properties addressed include characterization of ground and excited state properties as well as time resolved electron dynamics.

The individual techniques of electron spectroscopy include photoelectron spectroscopy of both outer and inner shells; inverse photoemission; spin-polarised photoemission; time resolved 2-photon photoemission, resonant and non-resonant Auger spectroscopy including ion neutralization studies; edge techniques (EXAFS, NEXAFS,...) , resonant and non-resonant inelastic X-ray scattering (RIXS), spectro-microscopy, high resolution electron energy loss spectroscopy; electron scattering and resonance electron capture; electron spectroscopy in conjunction with microscopy; penning ionization spectroscopy including scanning tunneling spectroscopy; theoretical treatments of the photoemission, X-ray emission, Auger, energy loss and Penning ionization processes. Contributions on instrumentation and technique development, date acquisition - analysis - quantification are also welcome.

Subject areas covered include spectroscopic characterization of materials and processes concerning:
- surfaces, interfaces, and thin films;
- atomic and molecular physics, clusters;
- semiconductor physics and chemistry;
- materials for photovoltaics;
- materials science including: metal surfaces, nanoparticles, ceramics, strongly correlated systems, polymers, biomaterials and other organic films;
- catalysis

Editorial board

Editors

  • W. Eberhardt
    German Electron Synchrotron DESY, Center for Free-Electron Laser Science, Notkestraße 85, 22607, Hamburg, Germany
  • A.P. Hitchcock
    McMaster University Brockhouse Institute for Materials Research Department of Chemistry and Chemical Biology, 1280 Main St.,, Hamilton, L8S 4M1, Ontario, Canada, Fax: +1-905-5212773
  • N. Kosugi
    Institute for Molecular Science, Nishigo-Naka 38, Myodaiji, 444-8585, Okazaki, Japan, Fax: +81-564-54-2254

Honorary Board

  • C.R. Brundle
    California, United States
  • G.E. McGuire
    Research Triangle Park, North Carolina, United States
  • T. Ohta
    Kyoto, Japan
  • J.-J. Pireaux
    Namur, Belgium

Editorial Board

  • H.W. Ade
    North Carolina State University, Raleigh, North Carolina, United States
  • P.S. Bagus
    University of North Texas, Denton, Texas, United States
  • H. Daimon
    Nara Institute of Science and Technology, Ikoma, Japan
  • H. Ebert
    Ludwig Maximilians University Munich, Munich, Germany
  • C.S. Fadley
    E O Lawrence Berkeley National Laboratory, Berkeley, California, United States
  • D.L. Feng
    Fudan University Department of Physics, Shanghai, China
  • X. Gao
    Shanghai Institute of Applied Physics Chinese Academy of Sciences, Shanghai, China
  • M. Grioni
    Federal Polytechnic School of Lausanne, Lausanne, Switzerland
  • F.M.F. de Groot PhD
    Utrecht University Organic Chemistry and Catalysis, Utrecht, Netherlands
  • U. Hergenhahn
    Max Planck Institute of Plasma Physics Greifswald Branch, Greifswald, Germany
  • D.-J. Huang
    National Synchrotron Radiation Research Center, Hsinchu, Taiwan
  • S. Kera
    Institute for Molecular Science, Okazaki, Japan
  • A. Kimura
    Hiroshima University, Higashi-Hiroshima, Japan
  • K.T. Leung
    University of Waterloo, Waterloo, Ontario, Canada
  • C. Miron
    SOLEIL, Gif sur Yvette, France
  • S. Molodtsov
    European XFEL GmbH, Schenefeld, Germany
  • A. Naves de Brito
    State University of Campinas, Campinas, São Paulo, Brazil
  • D. Prendergast
    E O Lawrence Berkeley National Laboratory, Berkeley, California, United States
  • D.D. Sarma
    Indian Institute of Science, Bengaluru, India
  • T. Schmitt
    Paul Scherrer Institute, Villigen, Switzerland
  • S. Suzer
    Bilkent University, Ankara, Turkey
  • M. Vos
    Australian National University, Canberra, Australia
  • P. Weightman
    University of Liverpool, Liverpool, United Kingdom
  • W. Werner
    TU Wien University, Wien, Austria
  • H.W. Yeom
    Pohang University of Science and Technology, Pohang, Korea, Republic of
  • M. Zharnikov
    Heidelberg University, Heidelberg, Germany